| 000 | 00942nam a2200253 4500 | ||
|---|---|---|---|
| 001 | 00026026 | ||
| 003 | PWmBRO | ||
| 005 | 20180324094048.0 | ||
| 008 | 940228s1990 nyua b 00110 eng | ||
| 020 | _a0716781794 | ||
| 082 | 0 | 0 | _a621.3/815/A161 |
| 100 | 0 | 0 | _aAbramovici, Miron. |
| 245 | 1 | 0 |
_aDigital systems testing and testable design / _cMiron Abramovici, Melvin A. Breuer, Arthur D. Friedman. |
| 260 | 0 |
_aNew York, NY : _bComputer Science Press, _cc1990. |
|
| 300 |
_axxi, 653 p. : _bill. |
||
| 490 | 1 | _aElectrical engineering, communications, and signal processing | |
| 504 | _aIncludes bibliographical references (p. 644-645) and index. | ||
| 650 | 0 |
_aDigital integrated circuits _xTesting. |
|
| 650 | 0 |
_aDigital integrated circuits _xDesign and construction. |
|
| 700 | 1 | 0 | _aBreuer, Melvin A. |
| 700 | 1 | 0 | _aFriedman, Arthur D. |
| 830 | 0 | _aElectrical engineering communications and signal processing series. | |
| 942 | _2ddc | ||
| 999 |
_c70687 _d70687 |
||