000 00740nam a2200253 4500
001 00512354
003 PWmBRO
008 850913s1976 nyua a o0011 eng l
082 0 0 _a545
090 0 0 _b545/Z65c
100 1 0 _aZief, Morris
245 1 0 _aContamination control in trace element analysis
_cMorris Zief, James W. Mitchell
260 0 0 _aNew York
_bWiley
_cc1976
300 0 0 _axiv, 262 p.
_bill
_c24 cm.
440 0 0 _aChemical analysis
_vv. 47
500 0 0 _a"A Wiley-Interscience publication."
595 0 0 _a0471611697
650 0 0 _aTrace elements
_xAnalysis
650 0 0 _aContamination (Technology)
700 1 0 _aMitchell, James W.
942 _2ddc
994 _a001038439 86148 0001
999 _c33025
_d33025