Characterization of thin films and solid surfaces using proton-induced X-ray emission / by Bruce D. Sartwell and Arthur B. Campbell, III.
By: Sartwell, Bruce D.
Contributor(s): Campbell, Arthur Byron | United States. Bureau of Mines.
Series: United States. Report of investigations: 8455; Report of investigations (United States. Bureau of Mines): 8455.Publisher: [Washington] : U.S. Dept. of the Interior, Bureau of Mines, 1980Description: 22 p. : ill.Subject(s): Thin films -- Effect of radiation on | Solids -- Surfaces | Proton-induced X-ray emission| Item type | Current location | Home library | Collection | Shelving location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|---|---|---|
Vertical Files
|
Matheson Library | Matheson Library | Vertical Files | Vertical Files | 530.41 S251c (Browse shelf) | Available | 082059 |
There are no comments for this item.