Abramovici, Miron. <br/><br/>
Digital systems testing and testable design / 
Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman. 
 - New York, NY :  Computer Science Press,  c1990. 
 - xxi, 653 p. :  ill. 
 - Electrical engineering, communications, and signal processing .
 - Electrical engineering communications and signal processing series. .
<br/><br/>Includes bibliographical references (p. 644-645) and index. 
<br/><br/><label>ISBN: </label>0716781794  
<br/><br/><label>Subjects--Topical Terms: </label><br/>Digital integrated circuits--Testing.<br/>Digital integrated circuits--Design and construction.
<br/><br/><label>Dewey Class. No.: </label>621.3/815/A161