Zief, Morris <br/><br/>
Contamination control in trace element analysis 
Morris Zief, James W. Mitchell 
 - New York  Wiley  c1976 
 - xiv, 262 p.  ill  24 cm. 
 - Chemical analysis  v. 47 .
<br/><br/> "A Wiley-Interscience publication." 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Trace elements--Analysis<br/>Contamination (Technology)
<br/><br/><label>Dewey Class. No.: </label>545