Digital integrated circuit testing from a quality perspective / Eugene R. Hnatek.
By: Hnatek, Eugene R.
Material type: BookPublisher: New York : Van Nostrand Reinhold, c1993Description: x, 179 p. : ill.ISBN: 0442006438.Subject(s): Digital integrated circuits -- Testing -- Quality controlItem type | Current location | Home library | Call number | Status | Date due | Barcode |
---|---|---|---|---|---|---|
Matheson Library | Matheson Library | 621.381548 H677 (Browse shelf) | 127 | 104219 |
Browsing Matheson Library Shelves Close shelf browser
No cover image available | No cover image available | No cover image available | No cover image available | |||||
621.381548 E38 Electronic test equipment | 621.381548 E38h Electronic test equipment | 621.381548 G333h How to get more out of low-cost electronic test equipment | 621.381548 H677 Digital integrated circuit testing from a quality perspective / | 621.381548 K52 Radio, television and audio test instruments / | 621.381548 N877 Introduction to instrumentation and measurements / | 621.381548 N884s Sensor and analyzer handbook |
There are no comments for this item.