Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.
By: Abramovici, Miron.
Contributor(s): Breuer, Melvin A | Friedman, Arthur D.
Material type:
BookSeries: Electrical engineering communications and signal processing series: Publisher: New York, NY : Computer Science Press, c1990Description: xxi, 653 p. : ill.ISBN: 0716781794 .Subject(s): Digital integrated circuits -- Testing | Digital integrated circuits -- Design and constructionDDC classification: 621.3/815/A161
| Item type | Current location | Home library | Collection | Shelving location | Call number | Status | Date due | Barcode |
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Books
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Matheson Library | Matheson Library | Main Collection | Main Collection | 621.3815 A161 (Browse shelf) | 127 | 091803 |
Includes bibliographical references (p. 644-645) and index.
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