Tests, measurements, and characterization of electro-optic devices and systems : proceedings / [edited by] Shekhar G. Wadekar.
Contributor(s): Wadekar, Shekhar G | International Society for Optical Engineering.
Material type:
BookSeries: SPIE proceedings series ; vol. 1180. Publisher: Bellingham, Washington : SPIE, 1989Description: vi, 196 p. : ill.ISBN: 0819402168.Subject(s): Electrooptical devices -- Measurement -- Conference proceedings | Electrooptics -- Measurement -- Conference proceedings
| Item type | Current location | Home library | Collection | Call number | Status | Notes | Date due | Barcode |
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Matheson Library | Matheson Library | Main Collection | 623.7314 T345 (Browse shelf) | Available | Recat. | 081340 |
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