Applied logistic regression / David W. Hosmer, Jr., Stanley Lemeshow.
By: Hosmer, David W
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Material type: 
BookSeries: Wiley series in probability and mathematical statisticsApplied probability and statistics. Publisher: New York : Wiley, c1989Description: xiii, 307 p. ; 24 cm.ISBN: 0471615536.Subject(s): Regression analysisDDC classification: 519.536 H827
| Item type | Current location | Home library | Collection | Shelving location | Call number | Status | Date due | Barcode |
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Books
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Matheson Library | Matheson Library | Main Collection | Main Collection | 519.536 H827 (Browse shelf) | Available | 140629 |
"A Wiley-Interscience publication."
Includes bibliographical references (p. 291-300) and index.
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